Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis
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چکیده
منابع مشابه
Afm Studies on Surface Morphology, Topography and Texture of Nanostructured Zinc Aluminum Oxide Thin Films
Zinc Aluminum Oxide (ZAO) thin films were deposited on glass substrates by DC reactive magnetron sputtering technique with high purity Zn and Al targets. After the deposition, the films were annealed in vacuum from 200 to 500 C. Surface roughness measurement of ZAO thin films in the nanometer scale can be accurately determined using the atomic force microscopy. Surface roughness and grain size ...
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ژورنال
عنوان ژورنال: Materials Science-Poland
سال: 2020
ISSN: 2083-134X
DOI: 10.2478/msp-2020-0033